Multiple Instance Learning with Critical Instance for Whole Slide Image Classification

Yuanpin Zhou, Yao Lu 0007. Multiple Instance Learning with Critical Instance for Whole Slide Image Classification. In 20th IEEE International Symposium on Biomedical Imaging, ISBI 2023, Cartagena, Colombia, April 18-21, 2023. pages 1-5, IEEE, 2023. [doi]

Abstract

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