Jianyi Zhou, Feng Li, Jinhao Dong, Hongyu Zhang 0002, Dan Hao. Cost-Effective Testing of a Deep Learning Model through Input Reduction. In Marco Vieira, Henrique Madeira, Nuno Antunes, Zheng Zheng 0001, editors, 31st IEEE International Symposium on Software Reliability Engineering, ISSRE 2020, Coimbra, Portugal, October 12-15, 2020. pages 289-300, IEEE, 2020. [doi]
Abstract is missing.