Sichi Zhou, Shouyu Liang, Qun Yang, Huafeng Zhou, Wei Jiang, Yubin He, Yingchen Li. Active Learning Based Labeling Method for Fault Disposal Pre-plans. In Hamido Fujita, Yinglin Wang, Yanghua Xiao, Ali Moonis, editors, Advances and Trends in Artificial Intelligence. Theory and Applications - 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Shanghai, China, July 19-22, 2023, Proceedings, Part I. Volume 13925 of Lecture Notes in Computer Science, pages 377-382, Springer, 2023. [doi]
Abstract is missing.