Parameter-Free Gaussian PSF Model for Extended Depth of Field in Brightfield Microscopy

Xu Zhou, Rafael Molina 0001, Yi Ma, Tianfu Wang, Dong Ni. Parameter-Free Gaussian PSF Model for Extended Depth of Field in Brightfield Microscopy. IEEE Transactions on Image Processing, 29:3227-3238, 2020. [doi]

Abstract

Abstract is missing.