Enhancing Adversarial Robustness for Deep Metric Learning

Mo Zhou, Vishal M. Patel. Enhancing Adversarial Robustness for Deep Metric Learning. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 15304-15313, IEEE, 2022. [doi]

Abstract

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