Jian Zhou, Xueyan Peng, Long Li. Data-driven Key Features Selection for Fault Detection in a Complex System. In EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020 - 8 November, 2020. pages 717-722, ACM, 2020. [doi]
Abstract is missing.