General Model for Manufacturing Defect Detection Crossing Multiple Products - researchr publication authors

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Longfei Zhou, Zhanghao Qin, Ping Xia, Jiabao Liu, Weihao Cheng, Yunwei Li, Leyi Ying, Qian Liu, Mengxin Liu, Gezhang Song, Zebo Huang, Zhou Hao. General Model for Manufacturing Defect Detection Crossing Multiple Products. In International Conference on Machine Learning and Applications, ICMLA 2023, Jacksonville, FL, USA, December 15-17, 2023. pages 1595-1600, IEEE, 2023. [doi]

This author has not been identified. Look up 'Longfei Zhou' in GoogleThis author has not been identified. Look up 'Zhanghao Qin' in GoogleThis author has not been identified. Look up 'Ping Xia' in GoogleThis author has not been identified. Look up 'Jiabao Liu' in GoogleThis author has not been identified. Look up 'Weihao Cheng' in GoogleThis author has not been identified. Look up 'Yunwei Li' in GoogleThis author has not been identified. Look up 'Leyi Ying' in GoogleThis author has not been identified. Look up 'Qian Liu' in GoogleThis author has not been identified. Look up 'Mengxin Liu' in GoogleThis author has not been identified. Look up 'Gezhang Song' in GoogleThis author has not been identified. Look up 'Zebo Huang' in GoogleThis author has not been identified. Look up 'Zhou Hao' in Google

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