Longfei Zhou, Zhanghao Qin, Ping Xia, Jiabao Liu, Weihao Cheng, Yunwei Li, Leyi Ying, Qian Liu, Mengxin Liu, Gezhang Song, Zebo Huang, Zhou Hao. General Model for Manufacturing Defect Detection Crossing Multiple Products. In International Conference on Machine Learning and Applications, ICMLA 2023, Jacksonville, FL, USA, December 15-17, 2023. pages 1595-1600, IEEE, 2023. [doi]
Abstract is missing.