A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register

Bin Zhou, Xin-chun Wu, Yu Sun, Tianqi Wang, Liyi Xiao. A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register. J. Low Power Electronics, 9(4):519-526, 2013. [doi]

Abstract

Abstract is missing.