Yue Zhou, Jinyao Yan. A Logistic Regression Based Approach for Software Test Management. In Bin Xie 0001, Xiaolong Xu, editors, International Conference on Cyber-Enabled Distributed Computing and Knowledge Discovery, CyberC 2016, Chengdu, China, October 13-15, 2016. pages 268-271, IEEE, 2016. [doi]
Abstract is missing.