Top-down drift-diffusion versus bottom-up quasi-ballistic formalism in device compact modeling

Xing Zhou, Junbin Zhang, Binit Syamal, Zhaomin Zhu, Hongtao Zhou, Siau Ben Chiah. Top-down drift-diffusion versus bottom-up quasi-ballistic formalism in device compact modeling. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 53, IEEE, 2013. [doi]

Abstract

Abstract is missing.