Jianchao Zhu, Dong Cheng, Qingjie Kong. An Industrial Defect Detection Platform Based on Rapid Iteration. In Yao Zhao, Nick Barnes, Baoquan Chen, Rüdiger Westermann, Xiangwei Kong, Chunyu Lin, editors, Image and Graphics - 10th International Conference, ICIG 2019, Beijing, China, August 23-25, 2019, Proceedings, Part III. Volume 11903 of Lecture Notes in Computer Science, pages 456-466, Springer, 2019. [doi]
Abstract is missing.