Hong Zhu, Volkan Kursun. Impact of process parameter and supply voltage fluctuations on multi-threshold-voltage seven-transistor static memory cells. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 448-453, IEEE, 2013. [doi]
@inproceedings{ZhuK13-0,
title = {Impact of process parameter and supply voltage fluctuations on multi-threshold-voltage seven-transistor static memory cells},
author = {Hong Zhu and Volkan Kursun},
year = {2013},
doi = {10.1109/ISQED.2013.6523650},
url = {http://dx.doi.org/10.1109/ISQED.2013.6523650},
researchr = {https://researchr.org/publication/ZhuK13-0},
cites = {0},
citedby = {0},
pages = {448-453},
booktitle = {International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4951-2},
}