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Xiaoli Zhu, Shin-Ichiro Kuroki, Koji Kotani, Hideharu Shido, Masatoshi Fukuda, Yasuyoshi Mishima, Takashi Ito. Characteristics of Nano-Grating N-Channel MOSFETs for Improved Current Drivability. IEICE Transactions, 90-C(9):1830-1836, 2007. [doi]