Xiaoli Zhu, Shin-Ichiro Kuroki, Koji Kotani, Hideharu Shido, Masatoshi Fukuda, Yasuyoshi Mishima, Takashi Ito. Characteristics of Nano-Grating N-Channel MOSFETs for Improved Current Drivability. IEICE Transactions, 90-C(9):1830-1836, 2007. [doi]
@article{ZhuKKSFMI07,
title = {Characteristics of Nano-Grating N-Channel MOSFETs for Improved Current Drivability},
author = {Xiaoli Zhu and Shin-Ichiro Kuroki and Koji Kotani and Hideharu Shido and Masatoshi Fukuda and Yasuyoshi Mishima and Takashi Ito},
year = {2007},
doi = {10.1093/ietele/e90-c.9.1830},
url = {http://dx.doi.org/10.1093/ietele/e90-c.9.1830},
researchr = {https://researchr.org/publication/ZhuKKSFMI07},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {90-C},
number = {9},
pages = {1830-1836},
}