Reliability estimation for one-shot devices under cyclic accelerated life-testing

Xiaojun Zhu, Kai Liu, Mu He, N. Balakrishnan 0002. Reliability estimation for one-shot devices under cyclic accelerated life-testing. Rel. Eng. & Sys. Safety, 212:107595, 2021. [doi]

Authors

Xiaojun Zhu

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Kai Liu

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Mu He

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N. Balakrishnan 0002

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