Xiaojun Zhu, Kai Liu, Mu He, N. Balakrishnan 0002. Reliability estimation for one-shot devices under cyclic accelerated life-testing. Rel. Eng. & Sys. Safety, 212:107595, 2021. [doi]
@article{ZhuLHB21,
title = {Reliability estimation for one-shot devices under cyclic accelerated life-testing},
author = {Xiaojun Zhu and Kai Liu and Mu He and N. Balakrishnan 0002},
year = {2021},
doi = {10.1016/j.ress.2021.107595},
url = {https://doi.org/10.1016/j.ress.2021.107595},
researchr = {https://researchr.org/publication/ZhuLHB21},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {212},
pages = {107595},
}