Xi Zhu, Hongchang Long, Zhiwei Li, Jietao Diao, Haijun Liu, Nan Li 0020, Hui Xu. Implication of unsafe writing on the MAGIC NOR gate. Microelectronics Journal, 103:104866, 2020. [doi]
@article{ZhuLLDL0X20,
title = {Implication of unsafe writing on the MAGIC NOR gate},
author = {Xi Zhu and Hongchang Long and Zhiwei Li and Jietao Diao and Haijun Liu and Nan Li 0020 and Hui Xu},
year = {2020},
doi = {10.1016/j.mejo.2020.104866},
url = {https://doi.org/10.1016/j.mejo.2020.104866},
researchr = {https://researchr.org/publication/ZhuLLDL0X20},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {103},
pages = {104866},
}