A new creep-fatigue life model of lead-free solder joint

Yongxin Zhu, Xiaoyan Li, Chao Wang, Ruiting Gao. A new creep-fatigue life model of lead-free solder joint. Microelectronics Reliability, 55(7):1097-1100, 2015. [doi]

Authors

Yongxin Zhu

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Xiaoyan Li

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Chao Wang

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Ruiting Gao

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