A multidimensional features fault diagnosis method for analog circuits - researchr publication authors

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Min Zhu, Jianjun Lin, Li Wang, Chunling Yang. A multidimensional features fault diagnosis method for analog circuits. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 382-387, IEEE, 2016. [doi]

This author has not been identified. Look up 'Min Zhu' in GoogleThis author has not been identified. Look up 'Jianjun Lin' in GoogleThis author has not been identified. Look up 'Li Wang' in GoogleThis author has not been identified. Look up 'Chunling Yang' in Google

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