A multidimensional features fault diagnosis method for analog circuits

Min Zhu, Jianjun Lin, Li Wang, Chunling Yang. A multidimensional features fault diagnosis method for analog circuits. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 382-387, IEEE, 2016. [doi]

Abstract

Abstract is missing.