More Powerful and Reliable Second-level Statistical Randomness Tests for NIST SP 800-22

Shuangyi Zhu, Yuan Ma, Jingqiang Lin, Jia Zhuang, Jiwu Jing. More Powerful and Reliable Second-level Statistical Randomness Tests for NIST SP 800-22. IACR Cryptology ePrint Archive, 2016:863, 2016. [doi]

Abstract

Abstract is missing.