Dongdi Zhu, Jiongjiong Mo, Shiyi Xu, Yong-Heng Shang, Zhiyu Wang, Zheng-Liang Huang, Fa-Xin Yu. A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement and Calibration in CMOS Technology. J. Electronic Testing, 32(3):393-397, 2016. [doi]
@article{ZhuMXSWHY16,
title = {A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement and Calibration in CMOS Technology},
author = {Dongdi Zhu and Jiongjiong Mo and Shiyi Xu and Yong-Heng Shang and Zhiyu Wang and Zheng-Liang Huang and Fa-Xin Yu},
year = {2016},
doi = {10.1007/s10836-016-5584-2},
url = {http://dx.doi.org/10.1007/s10836-016-5584-2},
researchr = {https://researchr.org/publication/ZhuMXSWHY16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {3},
pages = {393-397},
}