Fast Face Detection Using Subspace Discriminant Wavelet Features

Ying Zhu, Stuart C. Schwartz, Michael T. Orchard. Fast Face Detection Using Subspace Discriminant Wavelet Features. In 2000 Conference on Computer Vision and Pattern Recognition (CVPR 2000), 13-15 June 2000, Hilton Head, SC, USA. pages 1636-1642, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.