Zhenhai Zhu, Jacob White, Alper Demir. A stochastic integral equation method for modeling the rough surface effect on interconnect capacitance. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 887-891, IEEE Computer Society / ACM, 2004. [doi]
Abstract is missing.