Charlie Shucheng Zhu, Georg Weissenbacher, Divjyot Sethi, Sharad Malik. SAT-based techniques for determining backbones for post-silicon fault localisation. In Zeljko Zilic, Sandeep K. Shukla, editors, 2011 IEEE International High Level Design Validation and Test Workshop, HLDVT 2011, Napa Valley, CA, USA, November 9-11, 2011. pages 84-91, IEEE, 2011. [doi]
Abstract is missing.