Ming Zhu, Li-yi Xiao, Hong Wei Luo. New SEC-DED-DAEC codes for multiple bit upsets mitigation in memory. In IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, VLSI-SoC 2011, Kowloon, Hong Kong, China, October 3-5, 2011. pages 254-259, IEEE, 2011. [doi]
Abstract is missing.