A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD

Mingzhu Zhu, Junzhi Yu, Zhang Gao, Bingwei He, Jiantao Liu. A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD. IEEE Signal Process. Lett., 28:1065-1069, 2021. [doi]

Abstract

Abstract is missing.