Study and Implementation of 600-V High-Voltage Gate Driver IC With the Common-Mode Dual-Interlock Technique for GaN Devices - researchr publication authors

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Jing Zhu, Siyuan Yu, Yangyang Lu, Weifeng Sun, Chuanyi Cheng, Ding Yan, Yunwu Zhang, Shaohong Li, Long Zhang, Sen Zhang, Nailong He, Yan Gu. Study and Implementation of 600-V High-Voltage Gate Driver IC With the Common-Mode Dual-Interlock Technique for GaN Devices. IEEE Transactions on Industrial Electronics, 68(2):1506-1514, 2021. [doi]

This author has not been identified. Look up 'Jing Zhu' in GoogleThis author has not been identified. Look up 'Siyuan Yu' in GoogleThis author has not been identified. Look up 'Yangyang Lu' in GoogleThis author has not been identified. Look up 'Weifeng Sun' in GoogleThis author has not been identified. Look up 'Chuanyi Cheng' in GoogleThis author has not been identified. Look up 'Ding Yan' in GoogleThis author has not been identified. Look up 'Yunwu Zhang' in GoogleThis author has not been identified. Look up 'Shaohong Li' in GoogleThis author has not been identified. Look up 'Long Zhang' in GoogleThis author has not been identified. Look up 'Sen Zhang' in GoogleThis author has not been identified. Look up 'Nailong He' in GoogleThis author has not been identified. Look up 'Yan Gu' in Google

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