Lihong Zhu, Qiu-Wei Zheng, Yu-Jiao Ruan, Wei-Jie Guo, Yulin Gao, Ziquan Guo, Yue Lin, Tingzhu Wu, Zhong Chen 0005, Yi-Jun Lu. Remote Online Two-Step Stress Lifetime Acceleration Test System for Ultraviolet Light-Emitting Diodes. IEEE T. Instrumentation and Measurement, 70:1-7, 2021. [doi]
Abstract is missing.