Yuming Zhuang, Tao Chen 0006, Shravan K. Chaganti, Degang Chen. Effect of flicker noise on SEIR for accurate ADC linearity testing. In IEEE 58th International Midwest Symposium on Circuits and Systems, MWSCAS 2015, Fort Collins, CO, USA, August 2-5, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.