Impact of variability effects on FinFET transistors and combinational cells

Alexandra L. Zimpeck, Ricardo Reis. Impact of variability effects on FinFET transistors and combinational cells. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 440-441, IEEE, 2016. [doi]

@inproceedings{ZimpeckR16,
  title = {Impact of variability effects on FinFET transistors and combinational cells},
  author = {Alexandra L. Zimpeck and Ricardo Reis},
  year = {2016},
  doi = {10.1109/ICECS.2016.7841231},
  url = {http://dx.doi.org/10.1109/ICECS.2016.7841231},
  researchr = {https://researchr.org/publication/ZimpeckR16},
  cites = {0},
  citedby = {0},
  pages = {440-441},
  booktitle = {2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016},
  publisher = {IEEE},
  isbn = {978-1-5090-6113-6},
}