Impact of variability effects on FinFET transistors and combinational cells - researchr publication related

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Alexandra L. Zimpeck, Ricardo Reis. Impact of variability effects on FinFET transistors and combinational cells. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 440-441, IEEE, 2016. [doi]

The following publications are possibly variants of this publication:

Process variability in FinFET standard cells with different transistor sizing techniquesAlexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis. icecsys 2015: 121-124 [doi]

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