Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS - researchr publication

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Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez. Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS. IEEE T. Instrumentation and Measurement, 61(8):2212-2221, 2012. [doi]

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