Analog Automatic Test Pattern Generation for Quasi-Static Structural Test

Amir Zjajo, José Pineda de Gyvez. Analog Automatic Test Pattern Generation for Quasi-Static Structural Test. IEEE Trans. VLSI Syst., 17(10):1383-1391, 2009. [doi]

Authors

Amir Zjajo

This author has not been identified. Look up 'Amir Zjajo' in Google

José Pineda de Gyvez

This author has not been identified. Look up 'José Pineda de Gyvez' in Google