Lubomyr M. Zobniw. Multi-defect real time diagnosis using a single pin probe. In Donald J. Humcke, J. Michael Galey, Stephen A. Szygenda, Pat O. Pistilli, Nitta P. Dooner, Judith G. Brinsfield, J. S. Olila, editors, Proceedings of the 13th Design Automation Conference, DAC '76, San Francisco, California, USA, June 28-30, 1976. pages 179-185, ACM, 1976. [doi]
Abstract is missing.