Sanja Zonja, Mile Ivanda, Miroslav Ocko, Tomislav Suligoj, Marko Koricic, Petar Biljanovic. Structural and electronic properties of heavily phosphorus doped polycrystalline silicon thin films. In MIPRO, 2011 Proceedings of the 34th International Convention, Opatija, Croatia, 23-27 May, 2011. pages 33-38, IEEE, 2011. [doi]
@inproceedings{ZonjaIOSKB11,
title = {Structural and electronic properties of heavily phosphorus doped polycrystalline silicon thin films},
author = {Sanja Zonja and Mile Ivanda and Miroslav Ocko and Tomislav Suligoj and Marko Koricic and Petar Biljanovic},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5967019},
researchr = {https://researchr.org/publication/ZonjaIOSKB11},
cites = {0},
citedby = {0},
pages = {33-38},
booktitle = {MIPRO, 2011 Proceedings of the 34th International Convention, Opatija, Croatia, 23-27 May, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0996-8},
}