Structural and electronic properties of heavily phosphorus doped polycrystalline silicon thin films - researchr publication related

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Sanja Zonja, Mile Ivanda, Miroslav Ocko, Tomislav Suligoj, Marko Koricic, Petar Biljanovic. Structural and electronic properties of heavily phosphorus doped polycrystalline silicon thin films. In MIPRO, 2011 Proceedings of the 34th International Convention, Opatija, Croatia, 23-27 May, 2011. pages 33-38, IEEE, 2011. [doi]

The following publications are possibly variants of this publication:

On the application of boron and phosphorus heavily doped LPCVD polycrystalline silicon thin films as thermoelectric materialsSanja Zonja, Miroslav Ocko, Mile Ivanda, Tomislav Suligoj, Petar Biljanovic. miproBIS 2012: 19-20 [doi]

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