Designing Self-Testable Multi-Chip Modules

Yervant Zorian, Hakim Bederr. Designing Self-Testable Multi-Chip Modules. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 181-185, IEEE Computer Society, 1996. [doi]

Authors

Yervant Zorian

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Hakim Bederr

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