Designing Self-Testable Multi-Chip Modules

Yervant Zorian, Hakim Bederr. Designing Self-Testable Multi-Chip Modules. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 181-185, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.