Yervant Zorian, Sujit Dey, Mike Rodgers. Test of Future System-on-Chips. In Ellen Sentovich, editor, Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000. pages 392-398, IEEE, 2000.
@inproceedings{ZorianDR00,
title = {Test of Future System-on-Chips},
author = {Yervant Zorian and Sujit Dey and Mike Rodgers},
year = {2000},
tags = {testing},
researchr = {https://researchr.org/publication/ZorianDR00},
cites = {0},
citedby = {0},
pages = {392-398},
booktitle = {Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000},
editor = {Ellen Sentovich},
publisher = {IEEE},
isbn = {0-7803-6448-1},
}