Yervant Zorian, Erik Jan Marinissen, Rohit Kapur. On using IEEE P1500 SECT for test plug-n-play. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 770-777, IEEE Computer Society, 2000.
@inproceedings{ZorianMK00,
title = {On using IEEE P1500 SECT for test plug-n-play},
author = {Yervant Zorian and Erik Jan Marinissen and Rohit Kapur},
year = {2000},
tags = {testing},
researchr = {https://researchr.org/publication/ZorianMK00},
cites = {0},
citedby = {0},
pages = {770-777},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}