Wei Zou, Benoit Nadeau-Dostie. Configurable BISR Chain For Fast Repair Data Loading. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 56-62, IEEE, 2022. [doi]
@inproceedings{ZouN22,
title = {Configurable BISR Chain For Fast Repair Data Loading},
author = {Wei Zou and Benoit Nadeau-Dostie},
year = {2022},
doi = {10.1109/ITC50671.2022.00012},
url = {https://doi.org/10.1109/ITC50671.2022.00012},
researchr = {https://researchr.org/publication/ZouN22},
cites = {0},
citedby = {0},
pages = {56-62},
booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6270-9},
}