An insulator defect detection algorithm based on computer vision

Dan Zuo, Hong Hu 0002, Ronghui Qian, Ze Liu. An insulator defect detection algorithm based on computer vision. In IEEE International Conference on Information and Automation, ICIA 2017, Macau, SAR, China, July 18-20, 2017. pages 361-365, IEEE, 2017. [doi]

Abstract

Abstract is missing.