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Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter

Loic Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson. Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. In 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2013, Arlington, VA, USA, May 6-7, 2014. pages 130-135, IEEE, 2014. [doi]

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Loic Zussa

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Jean-Max Dutertre

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Jessy Clédière

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Bruno Robisson

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