Michael Zwerger, Helmut E. Graeb. Detection of asymmetric aging-critical voltage conditions in analog power-down mode. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1269-1272, ACM, 2015. [doi]
Abstract is missing.