Maciej Zygmunt, Marek Budyn, Michal Orkisz, James Ottewill, Victor H. Jaramillo, Agnieszka Nowak. Visual modeling of condition monitoring systems. In Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation, ETFA 2012, Krakow, Poland, September 17-21, 2012. pages 1-4, IEEE, 2012. [doi]
Abstract is missing.