Visual modeling of condition monitoring systems

Maciej Zygmunt, Marek Budyn, Michal Orkisz, James Ottewill, Victor H. Jaramillo, Agnieszka Nowak. Visual modeling of condition monitoring systems. In Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation, ETFA 2012, Krakow, Poland, September 17-21, 2012. pages 1-4, IEEE, 2012. [doi]

Abstract

Abstract is missing.