27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. IEEE, 2018. [doi]
Conference: ats2018
@proceedings{ats-2018,
title = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
year = {2018},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8566099},
researchr = {https://researchr.org/publication/ats-2018},
cites = {0},
citedby = {0},
booktitle = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
conference = {ats},
publisher = {IEEE},
isbn = {978-1-5386-9466-4},
}