Closing the Defect Reduction Gap between Software Inspection and Test-Driven Development: Applying Mutation Analysis to Iterative, Test-First Programming

Jerod W. Wilkerson. Closing the Defect Reduction Gap between Software Inspection and Test-Driven Development: Applying Mutation Analysis to Iterative, Test-First Programming. PhD thesis, University of Arizona, Tucson, USA, 2008. [doi]

Abstract

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