Abstract is missing.
- Model-Based Bayesian Deep Learning Architecture for Linear Inverse Problems in Computational ImagingCanberk Ekmekci, Mujdat Cetin. [doi]
- Extreme Face Inpainting with Sketch-Guided Conditional GANNilesh Pandey, Andreas E. Savakis. [doi]
- Limitations of CNNs for Approximating the Ideal Observer Despite Quantity of Training Data or Depth of NetworkKhalid Omer, Luca Caucci, Meredith K. Kupinski. [doi]
- Reducing motion artifact in sequential-scan dual-energy CT imaging by incorporating deformable registration within joint statistical image reconstructionTao Ge, Rui Liao, David G. Politte, Maria Medrano, Jeffrey F. Williamson, Bruce R. Whiting, Tianyu Zhao, Joseph A. O'Sullivan. [doi]
- Testing the Goodness of Model Fit in Tunable Diode Laser Absorption TomographyZeeshan Nadir, Kristin M. Rice, Michael S. Brown, Charles A. Bouman. [doi]
- Enhanced Material Estimation with Multi-Spectral CTSandamali Devadithya, David Castañón. [doi]
- Robustness of Fourier Ptychographic Imaging to Variation of System ParametersMoritz Siegel, Lukas Traxler, Laurin Ginner. [doi]
- Deep Learning Approach for Dynamic Sparse Sampling for High-Throughput Mass Spectrometry ImagingDavid Helminiak, Hang Hu 0012, Julia Laskin, Dong Hye Ye. [doi]
- Evaluating the Utility of Mueller Matrix Imaging for Diffuse Material ClassificationMeredith K. Kupinski, Lisa Li. [doi]
- Mask Recognition in the Covered Safe Entry ScannerHenry G. Dietz. [doi]